FLAGSHIP PRODUCT

Real-Time Test Intelligence for Electronics Manufacturing

HPDC ICT Data Collection and Analytics for electronics manufacturing test, traceability, and yield insights.

Transform your ICT, Flying Probe, and Functional Test data into actionable insights. NS-HPDCA connects directly to your testers, capturing every result in real-time and delivering the dashboards, analytics, and quality gates your production team needs.

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Why HPDCA?

Your Testers Generate Gigabytes of Data. Are You Using It?

Most manufacturing companies collect test logs but struggle to extract value from them. NS-HPDCA bridges that gap — automatically parsing log files, storing results in a structured database, and delivering real-time visibility into what's happening on your test floor.

  • See yields in real-time — No more waiting for end-of-shift reports
  • Catch problems early — Anomaly detection alerts you to yield drops instantly
  • Reduce debug time — Drill down to specific failures by board, component, or time
  • Prevent escapes — FQC quality gate stops failed units from shipping
  • Make data-driven decisions — Historical trends inform process improvements
NS-HPDCA Real-Time Dashboard - Yield, Top Defects, and Utilisation
Click to enlarge
How It Works

Two Systems, One Solution

NS-HPDC

Data Collector

The data collector runs on your test floor, connecting directly to your testers.

  • Direct connection to HP3070, Takaya APT, IFR4220, and more
  • Real-time log file parsing as tests complete
  • Secure storage in MySQL database
  • Custom parsers available for any tester format
  • Runs 24/7 with minimal maintenance

NS-HPDA

Data Analyser

The analysis platform delivers insights via web or desktop interface.

  • Real-time yield by product, line, shift
  • First-pass vs retest rates
  • Top defects by component/step
  • Cycle time and utilisation
  • Trend analysis over time
  • SPC charts (optional)
Quality Gate

FQC — Your Last Line of Defense

Problem: Failed boards sometimes slip through to shipping when operators miss test results.

Solution: NS-HPDCA includes an FQC (Final Quality Control) module that creates an unbreakable quality gate.

1

Scan Barcode

Operator scans board barcode at shipping station

2

Check Database

System checks test database for pass status

3

PASS

Green light — board can ship

4

FAIL

Red alert — board is quarantined

Result: Zero escapes of failed units to customers.

Features

Complete Feature Set

Data Collection

  • Real-time log file parsing
  • Multi-tester support
  • Automatic database storage
  • Historical data retention
  • Backup and recovery

Analytics & Reporting

  • Real-time yield dashboards
  • First-pass and retest analysis
  • Top defect Pareto charts
  • Cycle time tracking
  • Custom report builder
  • Excel/PDF export

Quality Control

  • FQC barcode scanning gate
  • Pass/fail verification
  • Audit trail logging
  • Quarantine management

Administration

  • User role management
  • Multi-site support
  • Email/SMS alerts
  • System health monitoring
  • VNC remote access

Integration

  • MES/ERP connectivity via REST API
  • UNS Ready (MQTT)
  • Database views for BI tools
  • Custom integrations available

Technical Specs

  • Database: MySQL
  • Web Interface: PHP, Bootstrap
  • Desktop App: Windows
  • Role-based security
  • On-premise or hosted
Proven Results

What You Can Expect

20%
Reduction in debug time
Instant
Detection of yield trends
Zero
Escapes with FQC gate
Hours
Saved weekly on reports
Compatibility

Supported Testers

NS-HPDCA connects to industry-leading ICT and Flying Probe equipment

Keysight/Agilent HP3070
Takaya APT Flying Probe
IFR4220 Functional Tester
Custom Parsers Available
See It In Action

Screenshots

Real-Time ICT Dashboard
Real-Time ICT Dashboard
HP Data Analyser
HP Data Analyser
HPDC Data Collector
HPDC Data Collector
Last Test Result - Pass
Last Test Result - Pass
Last Test Result - Fail
Last Test Result - Fail

Ready to Transform Your Test Data?

See HPDCA in action with a personalised demo. We'll show you how it connects to your testers and delivers the insights your team needs.

Request Demo Download PDF Presentation
customDB@nicks-software.com +61 416 563 915
FAQ

FAQ: ICT / Flying Probe Test Analytics

What is ICT test data analytics?

It’s the collection and analysis of in-circuit test (ICT) results so you can monitor yield, identify top failure modes and improve test and process performance.

Can it support Flying Probe testing too?

Yes. Flying Probe logs can be captured and analysed alongside ICT to give a full view of test performance.

Which testers can you integrate with?

Common integrations include HP3070, Takaya and other platforms, depending on log formats and connectivity.

What dashboards and reports are typical?

Yield over time, Pareto of failures/defects, test step breakdowns and product/line comparisons. Reports can be scheduled or exported as needed.

How is the data collected?

Typically by parsing test log files into a structured database, then presenting dashboards and trends through a web interface.

Can it integrate with other reporting systems?

Yes. Data can be exported or integrated into BI/reporting depending on your environment.